Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS)

Michelle L. La Haye, Glenn H. Chapman, Cory Jung, Desmond Y. H. Cheung, Sunjaya Djaja, Benjamin Wang, Gary Liaw, Yves Audet. Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS). In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 58-66, IEEE Computer Society, 2004. [doi]

Abstract

Abstract is missing.