Comprehensive Laser Sensitivity Profiling and Data Register Bit-Flips for Cryptographic Fault Attacks in 65 Nm FPGA - researchr publication related

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Wei He, Jakub Breier, Shivam Bhasin, Dirmanto Jap, Hock Guan Ong, Chee Lip Gan. Comprehensive Laser Sensitivity Profiling and Data Register Bit-Flips for Cryptographic Fault Attacks in 65 Nm FPGA. In Claude Carlet, M. Anwar Hasan, Vishal Saraswat, editors, Security, Privacy, and Applied Cryptography Engineering - 6th International Conference, SPACE 2016, Hyderabad, India, December 14-18, 2016, Proceedings. Volume 10076 of Lecture Notes in Computer Science, pages 47-65, Springer, 2016. [doi]

The following publications are possibly variants of this publication:

Extensive Laser Fault Injection Profiling of 65 nm FPGAJakub Breier, Wei He, Shivam Bhasin, Dirmanto Jap, Samuel Chef, Hock Guan Ong, Chee Lip Gan. jhss, 1(3):237-251, 2017. [doi]

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