Miao Tony He, Gustavo K. Contreras, Mark Tehranipoor, Dat Tran, LeRoy Winemberg. Test-point insertion efficiency analysis for LBIST applications. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1-6, IEEE Computer Society, 2016. [doi]
Abstract is missing.