Myron Hecht, David Baum, Joe Betser. Automated Failure Modes and Effects Analysis using SysML for Industrial Computer Network Reliability and Cybersecurity. In Joe Betser, Carol J. Fung, Alex Clemm, Jérôme François, Shingo Ata, editors, IFIP/IEEE International Symposium on Integrated Network Management, IM 2019, Washington, DC, USA, April 09-11, 2019. pages 500-514, IFIP, 2019. [doi]
Abstract is missing.