Clemens Helfmeier, Anne Beyreuther, Alexander Fox, Christian Boit. Ultra sensitive measurement of dielectric current under pulsed stress conditions. Microelectronics Reliability, 55(11):2254-2257, 2015. [doi]
@article{HelfmeierBFB15,
title = {Ultra sensitive measurement of dielectric current under pulsed stress conditions},
author = {Clemens Helfmeier and Anne Beyreuther and Alexander Fox and Christian Boit},
year = {2015},
doi = {10.1016/j.microrel.2015.06.119},
url = {http://dx.doi.org/10.1016/j.microrel.2015.06.119},
researchr = {https://researchr.org/publication/HelfmeierBFB15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {11},
pages = {2254-2257},
}