FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects

Sybille Hellebrand, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, Hans-Joachim Wunderlich. FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-8, IEEE, 2014. [doi]

Abstract

Abstract is missing.