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Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines

Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Patrick Heymans, Yves Le Traon. Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines. IEEE Trans. Software Eng., 40(7):650-670, 2014. [doi]

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