Christopher Henard, Mike Papadakis, Yves Le Traon. Mutation-Based Generation of Software Product Line Test Configurations. In Claire Le Goues, Shin Yoo, editors, Search-Based Software Engineering - 6th International Symposium, SSBSE 2014, Fortaleza, Brazil, August 26-29, 2014. Proceedings. Volume 8636 of Lecture Notes in Computer Science, pages 92-106, Springer, 2014. [doi]
Abstract is missing.