Using Line Segments as Structuring Elements for Sampling-Invariant Measurements

Cris L. Luengo Hendriks, Lucas J. van Vliet. Using Line Segments as Structuring Elements for Sampling-Invariant Measurements. IEEE Trans. Pattern Anal. Mach. Intell., 27(11):1826-1831, 2005. [doi]

Abstract

Abstract is missing.