Jörg Henkel. The triangle of power density, circuit degradation and reliability. In Massimo Alioto, Hai Helen Li, Jürgen Becker, Ulf Schlichtmann, Ramalingam Sridhar, editors, 30th IEEE International System-on-Chip Conference, SOCC 2017, Munich, Germany, September 5-8, 2017. pages 1-2, IEEE, 2017. [doi]
Abstract is missing.