Seongmoo Heo, Kenneth C. Barr, Mark Hampton, Krste Asanovic. Dynamic Fine-Grain Leakage Reduction Using Leakage-Biased Bitlines. In 29th International Symposium on Computer Architecture (ISCA 2002), 25-29 May 2002, Anchorage, AK, USA. pages 137-147, IEEE Computer Society, 2002. [doi]
Abstract is missing.