Annelie Heuser, Werner Schindler, Marc Stöttinger. Revealing side-channel issues of complex circuits by enhanced leakage models. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 1179-1184, IEEE, 2012. [doi]
Abstract is missing.