Shohei Hido, Shoko Suzuki, Risa Nishiyama, Takashi Imamichi, Rikiya Takahashi, Tetsuya Nasukawa, Tsuyoshi Idé, Yusuke Kanehira, Rinju Yohda, Takeshi Ueno, Akira Tajima, Toshiya Watanabe. Modeling Patent Quality: A System for Large-scale Patentability Analysis using Text Mining. JIP, 20(3):655-666, 2012. [doi]
Abstract is missing.