Yusuke Higashi, Anirudh Varanasi, Philippe J. Roussel, Pablo Saraza-Canflanca, J. P. Bastos, Alexander Grill, E. Catapano, R. Asanovski, Jacopo Franco, Ben Kaczer, Adrian Chasin, Devin Verreck, S. Ramesh, Laurent Breuil, Antonio Arreghini, S. Rachidi, Y. Jeong, Geert Van den bosch, Maarten Rosmeulen, Robin Degraeve. Advanced RTN Analysis on 3D NAND Trench Devices Using Physics-Informed Machine Learning Framework. In IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025. pages 1-6, IEEE, 2025. [doi]
@inproceedings{HigashiVRSBGCAF25,
title = {Advanced RTN Analysis on 3D NAND Trench Devices Using Physics-Informed Machine Learning Framework},
author = {Yusuke Higashi and Anirudh Varanasi and Philippe J. Roussel and Pablo Saraza-Canflanca and J. P. Bastos and Alexander Grill and E. Catapano and R. Asanovski and Jacopo Franco and Ben Kaczer and Adrian Chasin and Devin Verreck and S. Ramesh and Laurent Breuil and Antonio Arreghini and S. Rachidi and Y. Jeong and Geert Van den bosch and Maarten Rosmeulen and Robin Degraeve},
year = {2025},
doi = {10.1109/IRPS48204.2025.10983878},
url = {https://doi.org/10.1109/IRPS48204.2025.10983878},
researchr = {https://researchr.org/publication/HigashiVRSBGCAF25},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025},
publisher = {IEEE},
isbn = {979-8-3315-0477-9},
}