Reliability-Aware Multi-Vth Domain Digital Design Assessment

Theodor Hillebrand, Ludwig Karsthof, Steffen Paul, Dagmar Peters-Drolshagen. Reliability-Aware Multi-Vth Domain Digital Design Assessment. In 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2018, Budapest, Hungary, April 25-27, 2018. pages 1-4, IEEE, 2018. [doi]

Abstract

Abstract is missing.