Atsushi Hirai, Yukari Yamauchi, Toshinori Hosokawa, Masayuki Arai. A low capture power test generation method using capture safe test vectors. In 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015. pages 1-2, IEEE, 2015. [doi]
Abstract is missing.