BIST-Aided Scan Test - A New Method for Test Cost Reduction

Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama. BIST-Aided Scan Test - A New Method for Test Cost Reduction. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 359-364, IEEE Computer Society, 2003. [doi]

Abstract

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