Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama. BIST-Aided Scan Test - A New Method for Test Cost Reduction. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 359-364, IEEE Computer Society, 2003. [doi]
@inproceedings{HiraideBKIEYM03,
title = {BIST-Aided Scan Test - A New Method for Test Cost Reduction},
author = {Takahisa Hiraide and Kwame Osei Boateng and Hideaki Konishi and Koichi Itaya and Michiaki Emori and Hitoshi Yamanaka and Takashi Mochiyama},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/vts/2003/1924/00/19240359abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/HiraideBKIEYM03},
cites = {0},
citedby = {0},
pages = {359-364},
booktitle = {21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1924-5},
}