Yushiro Hiramoto, Satoshi Ohtake, Hiroshi Takahashi. A Built-In Self-Diagnostic Mechanism for Delay Faults Based on Self-Generation of Expected Signatures. In 28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019. pages 31-36, IEEE, 2019. [doi]
Abstract is missing.