Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design

Kazuya Hisamitsu, Hiroaki Ueno, Masayasu Tanaka, Daisuke Kitamaru, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama. Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design. In Hiroto Yasuura, editor, Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003. pages 179-183, ACM, 2003. [doi]

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