Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design

Kazuya Hisamitsu, Hiroaki Ueno, Masayasu Tanaka, Daisuke Kitamaru, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama. Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design. In Hiroto Yasuura, editor, Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003. pages 179-183, ACM, 2003. [doi]

@inproceedings{HisamitsuUTKMMKYYN03,
  title = {Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design},
  author = {Kazuya Hisamitsu and Hiroaki Ueno and Masayasu Tanaka and Daisuke Kitamaru and Mitiko Miura-Mattausch and Hans Jürgen Mattausch and Shigetaka Kumashiro and Tetsuya Yamaguchi and Kyoji Yamashita and Noriaki Nakayama},
  year = {2003},
  doi = {10.1145/1119772.1119807},
  url = {http://doi.acm.org/10.1145/1119772.1119807},
  researchr = {https://researchr.org/publication/HisamitsuUTKMMKYYN03},
  cites = {0},
  citedby = {0},
  pages = {179-183},
  booktitle = {Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003},
  editor = {Hiroto Yasuura},
  publisher = {ACM},
  isbn = {0-7803-7660-9},
}