An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs

T.-P. Ho, E. Faehn, Arnaud Virazel, Alberto Bosio, P. Girard. An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs. In IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018. pages 1-8, IEEE, 2018. [doi]

Abstract

Abstract is missing.