Comparison of Impedance Matching Networks for Scanning Microwave Microscopy - researchr publication authors

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Johannes Hoffmann, Sophie De Préville, Bruno Eckmann, Hung-Ju Lin, Benedikt Herzog, Kamel Haddadi, Didier Théron, Georg Gramse, Damien Richert, José Morán-Meza, François Piquemal. Comparison of Impedance Matching Networks for Scanning Microwave Microscopy. IEEE T. Instrumentation and Measurement, 73:1-9, 2024. [doi]

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