Comparison of Impedance Matching Networks for Scanning Microwave Microscopy

Johannes Hoffmann, Sophie De Préville, Bruno Eckmann, Hung-Ju Lin, Benedikt Herzog, Kamel Haddadi, Didier Théron, Georg Gramse, Damien Richert, José Morán-Meza, François Piquemal. Comparison of Impedance Matching Networks for Scanning Microwave Microscopy. IEEE T. Instrumentation and Measurement, 73:1-9, 2024. [doi]

@article{HoffmannPELHHTGRMP24,
  title = {Comparison of Impedance Matching Networks for Scanning Microwave Microscopy},
  author = {Johannes Hoffmann and Sophie De Préville and Bruno Eckmann and Hung-Ju Lin and Benedikt Herzog and Kamel Haddadi and Didier Théron and Georg Gramse and Damien Richert and José Morán-Meza and François Piquemal},
  year = {2024},
  doi = {10.1109/TIM.2024.3378310},
  url = {https://doi.org/10.1109/TIM.2024.3378310},
  researchr = {https://researchr.org/publication/HoffmannPELHHTGRMP24},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {73},
  pages = {1-9},
}