Damien Hogan, Tom Arbuckle, Conor Ryan. Estimating MLC NAND flash endurance: a genetic programming based symbolic regression application. In Christian Blum, Enrique Alba, editors, Genetic and Evolutionary Computation Conference, GECCO '13, Amsterdam, The Netherlands, July 6-10, 2013. pages 1285-1292, ACM, 2013. [doi]
Abstract is missing.