Sören Hommel, Nicole Killat, A. Altes, Thomas Schweinböck, Doris Schmitt-Landsiedel, M. Silvestri, O. Haeberlen. Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale. Microelectronics Reliability, 64:310-312, 2016. [doi]
Abstract is missing.