Sören Hommel, Nicole Killat, A. Altes, Thomas Schweinböck, Doris Schmitt-Landsiedel, M. Silvestri, O. Haeberlen. Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale. Microelectronics Reliability, 64:310-312, 2016. [doi]
@article{HommelKASSSH16,
title = {Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale},
author = {Sören Hommel and Nicole Killat and A. Altes and Thomas Schweinböck and Doris Schmitt-Landsiedel and M. Silvestri and O. Haeberlen},
year = {2016},
doi = {10.1016/j.microrel.2016.07.134},
url = {http://dx.doi.org/10.1016/j.microrel.2016.07.134},
researchr = {https://researchr.org/publication/HommelKASSSH16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {64},
pages = {310-312},
}