A Value-Added Predictive Defect Type Distribution Model Based on Project Characteristics

Youngki Hong, Jongmoon Baik, In-Young Ko, Ho-Jin Choi. A Value-Added Predictive Defect Type Distribution Model Based on Project Characteristics. In Roger Y. Lee, editor, 7th IEEE/ACIS International Conference on Computer and Information Science, IEEE/ACIS ICIS 2008, 14-16 May 2008, Portland, Oregon, USA. pages 469-474, IEEE Computer Society, 2008. [doi]

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