A Value-Added Predictive Defect Type Distribution Model Based on Project Characteristics

Youngki Hong, Jongmoon Baik, In-Young Ko, Ho-Jin Choi. A Value-Added Predictive Defect Type Distribution Model Based on Project Characteristics. In Roger Y. Lee, editor, 7th IEEE/ACIS International Conference on Computer and Information Science, IEEE/ACIS ICIS 2008, 14-16 May 2008, Portland, Oregon, USA. pages 469-474, IEEE Computer Society, 2008. [doi]

@inproceedings{HongBKC08,
  title = {A Value-Added Predictive Defect Type Distribution Model Based on Project Characteristics},
  author = {Youngki Hong and Jongmoon Baik and In-Young Ko and Ho-Jin Choi},
  year = {2008},
  doi = {10.1109/ICIS.2008.36},
  url = {http://doi.ieeecomputersociety.org/10.1109/ICIS.2008.36},
  tags = {rule-based},
  researchr = {https://researchr.org/publication/HongBKC08},
  cites = {0},
  citedby = {0},
  pages = {469-474},
  booktitle = {7th IEEE/ACIS International Conference on Computer and Information Science, IEEE/ACIS ICIS 2008, 14-16 May 2008, Portland, Oregon, USA},
  editor = {Roger Y. Lee},
  publisher = {IEEE Computer Society},
  isbn = {978-0-7695-3131-1},
}