Jozef Hooman, Arjan J. Mooij, Hans van Wezep. Early Fault Detection in Industry Using Models at Various Abstraction Levels. In John Derrick, Stefania Gnesi, Diego Latella, Helen Treharne, editors, Integrated Formal Methods - 9th International Conference, IFM 2012, Pisa, Italy, June 18-21, 2012. Proceedings. Volume 7321 of Lecture Notes in Computer Science, pages 268-282, Springer, 2012. [doi]
Abstract is missing.