Characterization of digital cells for statistical test

Fabian Hopsch, Michael Lindig, Bernd Straube, Wolfgang Vermeiren. Characterization of digital cells for statistical test. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 255-260, IEEE, 2011. [doi]

Abstract

Abstract is missing.