Single-Event Upset Analysis and Protection in High Speed Circuits

Mohammad Hosseinabady, Pejman Lotfi-Kamran, Giorgio Di Natale, Stefano Di Carlo, Alfredo Benso, Paolo Prinetto. Single-Event Upset Analysis and Protection in High Speed Circuits. In 11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK. pages 29-34, IEEE Computer Society, 2006. [doi]

Abstract

Abstract is missing.