Single-Event Upset Analysis and Protection in High Speed Circuits

Mohammad Hosseinabady, Pejman Lotfi-Kamran, Giorgio Di Natale, Stefano Di Carlo, Alfredo Benso, Paolo Prinetto. Single-Event Upset Analysis and Protection in High Speed Circuits. In 11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK. pages 29-34, IEEE Computer Society, 2006. [doi]

Authors

Mohammad Hosseinabady

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Pejman Lotfi-Kamran

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Giorgio Di Natale

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Stefano Di Carlo

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Alfredo Benso

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Paolo Prinetto

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