Mohammad Hosseinabady, Pejman Lotfi-Kamran, Giorgio Di Natale, Stefano Di Carlo, Alfredo Benso, Paolo Prinetto. Single-Event Upset Analysis and Protection in High Speed Circuits. In 11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK. pages 29-34, IEEE Computer Society, 2006. [doi]
@inproceedings{HosseinabadyLNCBP06, title = {Single-Event Upset Analysis and Protection in High Speed Circuits}, author = {Mohammad Hosseinabady and Pejman Lotfi-Kamran and Giorgio Di Natale and Stefano Di Carlo and Alfredo Benso and Paolo Prinetto}, year = {2006}, doi = {10.1109/ETS.2006.41}, url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2006.41}, tags = {analysis}, researchr = {https://researchr.org/publication/HosseinabadyLNCBP06}, cites = {0}, citedby = {0}, pages = {29-34}, booktitle = {11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK}, publisher = {IEEE Computer Society}, isbn = {0-7695-2566-0}, }