Jeroen Van Houtte, Xiaoru Gao, Jan Sijbers, Guoyan Zheng. 2D/3D Registration with a Statistical Deformation Model Prior Using Deep Learning. In IEEE EMBS International Conference on Biomedical and Health Informatics, BHI 2021, Athens, Greece, July 27-30, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.