Practical use of sequential ATPG for model checking: going the extra mile does pay off

Michael S. Hsiao, Jawahar Jain. Practical use of sequential ATPG for model checking: going the extra mile does pay off. In Proceedings of the Sixth IEEE International High-Level Design Validation and Test Workshop 2001, Monterey, California, USA, November 7-9, 2001. pages 39-44, IEEE Computer Society, 2001. [doi]

Abstract

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