Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors

Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel. Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 188-195, IEEE Computer Society, 1997. [doi]

Abstract

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