Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer. An Error-Oriented Test Methodology to Improve Yield with Error-Tolerance. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 130-135, IEEE Computer Society, 2006. [doi]
Abstract is missing.