Tsung-Fu Hsieh, Jin-Fu Li, Kuan-Te Wu, Jenn-Shiang Lai, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou. Software-hardware-cooperated built-in self-test scheme for channel-based DRAMs. In International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017. pages 107-111, IEEE, 2017. [doi]
Abstract is missing.