Failure Factor Based Yield Enhancement for SRAM Designs

Yu-Tsao Hsing, Chih-Wea Wang, Ching-Wei Wu, Chih-Tsun Huang, Cheng-Wen Wu. Failure Factor Based Yield Enhancement for SRAM Designs. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 20-28, IEEE Computer Society, 2004. [doi]

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