Chung-Ti Hsu, Shu-Chuan Chen, Yen-Hsien Chen, Yu-Ti Su, Ming-Fang Lai, Che-Hung Chen, Po-An Chen. Cumulative electrostatic discharge induced degradation of power-rail ESD clamp device in high-voltage CMOS/DMOS technologies. In IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2008, Macao, China, November 30 2008 - December 3, 2008. pages 49-52, IEEE, 2008. [doi]
Abstract is missing.