Fault-Pattern Oriented Defect Diagnosis for Flash Memory

Mu-Hsien Hsu, Yu-Tsao Hsing, Jen-Chieh Yeh, Cheng-Wen Wu. Fault-Pattern Oriented Defect Diagnosis for Flash Memory. In 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan. pages 3-8, IEEE Computer Society, 2006. [doi]

Abstract

Abstract is missing.