Wen-Jay Hsu, Bing J. Sheu, Vance C. Tyree. Digital and analog integrated-circuit design with built-in reliability. In Computer Design: VLSI in Computers and Processors, ICCD 1989. Proceedings., 1989 IEEE International Conference on, Cambridge, MA, USA, October 2-4, 1989. pages 496-499, IEEE, 1989. [doi]
Abstract is missing.