Built-In Speed Grading with a Process-Tolerant ADPLL

Hsuan-Jung Hsu, Chun-Chieh Tu, Shi-Yu Huang. Built-In Speed Grading with a Process-Tolerant ADPLL. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 384-392, IEEE, 2007. [doi]

@inproceedings{HsuTH07,
  title = {Built-In Speed Grading with a Process-Tolerant ADPLL},
  author = {Hsuan-Jung Hsu and Chun-Chieh Tu and Shi-Yu Huang},
  year = {2007},
  doi = {10.1109/ATS.2007.38},
  url = {https://doi.org/10.1109/ATS.2007.38},
  researchr = {https://researchr.org/publication/HsuTH07},
  cites = {0},
  citedby = {0},
  pages = {384-392},
  booktitle = {16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007},
  publisher = {IEEE},
  isbn = {978-0-7695-2890-8},
}