TASSER: A temperature-aware statistical soft-error-rate analysis framework for combinational circuits

Sung S.-Y. Hsueh, Ryan H.-M. Huang, Charles H.-P. Wen. TASSER: A temperature-aware statistical soft-error-rate analysis framework for combinational circuits. In Fifteenth International Symposium on Quality Electronic Design, ISQED 2014, Santa Clara, CA, USA, March 3-5, 2014. pages 529-534, IEEE, 2014. [doi]

Abstract

Abstract is missing.