Pei-Ying Hsueh, Shuo-Fen Kuo, Chao-Wen Tzeng, Jih-Nung Lee, Chi-Feng Wu. Case study of yield learning through in-house flow of volume diagnosis. In 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013, Hsinchu, Taiwan, April 22-24, 2013. pages 1-4, IEEE, 2013. [doi]
Abstract is missing.