An Open-Circuit Faults Diagnosis Method for MMC Based on Extreme Gradient Boosting

Xue Hu, Hefei Jia, Yuedong Zhang, Yan Deng. An Open-Circuit Faults Diagnosis Method for MMC Based on Extreme Gradient Boosting. IEEE Transactions on Industrial Electronics, 70(6):6239-6249, June 2023. [doi]

Abstract

Abstract is missing.