Xin Hu, Jung Hoon Lee, Jacob White, Luca Daniel. Analysis of full-wave conductor system impedance over substrate using novel integration techniques. In William H. Joyner Jr., Grant Martin, Andrew B. Kahng, editors, Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005. pages 147-152, ACM, 2005. [doi]
Abstract is missing.