Linghuan Hu, W. Eric Wong, D. Richard Kuhn, Raghu Kacker. MCDC-Star: A White-Box Based Automated Test Generation for High MC/DC Coverage. In 5th International Conference on Dependable Systems and Their Applications, DSA 2018, Dalian, China, September 22-23, 2018. pages 102-112, IEEE, 2018. [doi]
Abstract is missing.