Reverse-Bias Stability and Reliability of Enhancement-mode GaN-based MIS-FET

Mengyuan Hua, Song Yang, Jin Wei, Zheyang Zheng, Jiabei He, Kevin J. Chen. Reverse-Bias Stability and Reliability of Enhancement-mode GaN-based MIS-FET. In 13th IEEE International Conference on ASIC, ASICON 2019, Chongqing, China, October 29 - November 1, 2019. pages 1-4, IEEE, 2019. [doi]

Abstract

Abstract is missing.